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±¤ÀüÀÚÁ¤¹Ð(ÁÖ)Àº LED ¹× OLDE, PD, LD, Display, ÀϹݱ¤¿ø, Á¶¸í±â±¸ µîÀÇ ´Ù¾çÇÑ Æ¯¼ºÀ» ÃøÁ¤ÇÏ´Â °èÃøÀåºñ Àü¹®±â¾÷À¸·Î½á, ÇöÀç 30¿©°¡Áö Àåºñ¸¦ Á¦Á¶ ¹× ÆÇ¸ÅÇϰí ÀÖÀ¸¸ç ƯÈ÷ LED ¹× Á¶¸í ÃøÁ¤ºÐ¾ß¿¡¼­ ±¹³» ÃÖ°íÀÇ ±â¼ú¼±µµ±â¾÷ÀÓÀ» ÀÚºÎÇÕ´Ï´Ù.
±â°è, ÀüÀÚ, °í¾ÆÇÐ, ¼ÒÇÁÆ®¿þ¾î¿¡ ´ëÇÑ Æ°Æ°ÇÑ Áö½Ä°ú Á¦Ç°È­ ´É·ÂÀ» ±â¹ÝÀ¸·Î ±¤ ¹× ¹ÝµµÃ¼ ¼ÒÀÚ °èÃø ºÐ¾ß¿¡¼­ °í°´¸¸Á·À» ½ÇÇöÇØ¿À°í ÀÌ씅¸ç, ¼¼°èÀû ¼±µÎ±â¾÷À¸·Î ÃÖ°íÀÇ ¼­ºñ½º¸¦ Á¦°øÇϱâ À§ÇØ ÀüÁøÇÏ´Â ±â¾÷ÀÔ´Ï´Ù.
±¤ÀüÀÚÁ¤¹Ð(ÁÖ)ÀÇ LED Tester´Â ±¹³» ´ë±â¾÷ü´Â ¹°·Ð ¿¬±¸±â°ü µî LED Tester°¡ ÇÊ¿äÇÑ °÷¿¡´Â °ÅÀÇ ³³Ç°ÀÌ µÇ¾î °ü·Ã ¿£Áö´Ï¾îÀÇ È£ÆòÀ» ¹Þ°í ÀÖÀ¸¸ç, ¸Å³â LED EXPOµî °ü·Ã ±¹³»¿Ü Àü½Åȸ Âü°¡¸¦ ÅëÇØ °í°´ÀÇ ÀǰßÀ» ¼ö·ÅÇÏ°í ½ÅÁ¦Ç°À» Ãâ½ÃÇϰí ÀÖÀ¸¸ç, ¸Å³â ÀÌÀÍÀÇ ÀϺθ¦ »çȸ¿¡ ±âºÎÇÏ´Â Å©¸®½ºÃ® ¹®È­±â¾÷ÀÇ ºñÀüÀ» ½ÇÇöÇØ°¡°í ÀÖ½À´Ï´Ù.

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2009 Àü¶óºÏµµ ¼öÃâÀ¯¸ÁÁß¼Ò±â¾÷ ¼±Á¤
ÀüºÏ Å×Å©³ëÆÄÅ© °¡Á·±â¾÷ ¼±Á¤
ȯ°æ°æ¿µ ÀÎÁõȹµæ ISO 14001:2004
Àü¶óºÏµµ ¼±µµ±â¾÷ ¼±Á¤
DSSL 2009 Àü½Ãȸ Âü°¡ ¹× Çмú´ëȸ ³í¹®¹ßÇ¥
Lighting Japan 2009 LED/OLED Lighting Technology Expo Âü°¡
Hong Kong International Lighting Fair 2009 (Autumn Edition)Âü°¡
Lighting Korea 2009 Âü°¡
LED EXPO 2009 Âü°¡
´ë±¸ ÀÚµ¿È­ Àü½Ãȸ 2009 Âü°¡
Áö¿ª»ê¾÷±â¼ú°³¹ß»ç¾÷ °úÁ¦ ¼±Á¤
   - ¿µ»ó ó¸® ¹æ½ÄÀ» ÀÌ¿ëÇÑ ÀÚµ¿Â÷ ÀüÁ¶µî °Ë»ç Àåºñ °³¹ß
ƯÇãÀç»ê±Ç ¿¬±¸°³¹ß °úÁ¦ ¼±Á¤
LED Á¶¸í±â±â ½ÃÇè±â°ü(Çѱ¹»ê¾÷±â¼ú½ÃÇè¿ø)¿¡ ÃøÁ¤Àåºñ ³³Ç°

¡¡2008 Àü¶óºÏµµ À¯¸ÁÁß¼Ò±â¾÷ ¼±Á¤
BLU Inspection System °³¹ß ¹× ƯÇãÃâ¿ø
ÀÌ´ÞÀÇ Áß¼Ò±â¾÷ ¿ì¼öÁ¦Ç° ¼±Á¤
Çѱ¹ Ç¥ÁذúÇÐ ¿¬±¸¿ø°ú ±â¼úÀÌÀü °è¾à ü°á
Áß¼Ò±â¾÷±â¼úÇõ½Å°³¹ß»ç¾÷ °úÁ¦ ¼±Á¤
   - °íÃâ·Â LED¸ðµâÀÇ ½Å·Ú¼ºÆò°¡Àåºñ °³¹ß
LED Á¶¸í±â±â ½ÃÇè±â°ü(Çѱ¹Àü±âÀüÀÚ½ÃÇ迬±¸¿ø)¿¡ ÃøÁ¤Àåºñ ³³Ç°

¡¡2007 INNO-BIZ ¼±Á¤
Wafer-level ¹ß±¤¼ÒÀÚ ÁöÇâ°¢ ÃøÁ¤¹æ¹ý ¹× ÀåÄ¡ ƯÇãµî·Ï
LED Á¶¸í±â±â¸¦ À§ÇÑ ±¤ÃøÁ¤¹ý ƯÇãÃâ¿ø


2006 º¥Ã³±â¾÷ ÀÎÁõ
»ê¾÷±â¼úÀÚ¿øºÎ °úÁ¦¼öÇà
   - Pulse ±¸µ¿Çü LED ¸ðµâ ÀÚµ¿°èÃø½Ã½ºÅÛ °³¹ß
±¤µµÃøÁ¤Å¬·´ ¹× LED Ç¥ÁØÈ­ ÄÁ¼Ò½Ã¾ö Âü¿©
PD(Photo Diode) Goniometer (OPI-350) °³¹ß
Module Tester °³¹ß
ISO 9001:2000, KSA 9001:2001 ÀÎÁõȹµæ


2005 Çѱ¹»ê¾÷±â¼úÁøÈïÇùȸ ÀÎÁ¤ ±â¾÷ºÎ¼³¿¬±¸¼Ò ¼³¸³
¹Ú¼º¸² ´ëÇ¥ÀÌ»ç ÃëÀÓ
Áß¼Ò±â¾÷±â¼ú Çõ½Å°úÁ¦ ¼öÇà
LED Thermal Tester(OPI-600) °³¹ß
Multi-channel LEOS °³¹ß
LED Temperature controllable Adapter(OPA-100) °³¹ß
»ç¾÷ÀåÀÌÀü - ÀüÁÖ Ã·´Üº¥Ã³´ÜÁö


2004 Ÿ¿øÆí±¤ºÐ¼®±â ÀÚµ¿Á¤·Ä °ü·Ã ¹Ì±¹ ƯÇãÃëµæ
µî·ÏÁ¶¸í¿ë LED ÃøÁ¤±â¼ú Ç¥ÁØÈ­ Æ÷·³Âü¿©
´ëÇü Goniometer(OPI-310) °³¹ß
PD on Block Tester(OPI-500) ¹× PD Package Tester(OPI-510) °³¹ß
In-line LEOS °³¹ß


2003 LED Chip Prober, LEOS(OPI-100) °³¹ß
Goniophotometer(OPI-300) °³¹ß
Optical Power Meter(OPI-400) °³¹ß


2002 Rotating Analyzer Ellipsometer °³¹ß
Spectrometer ½ÅÁ¦Ç°(OPI-2100) °³¹ß
PD Chip Prober ¹× LED Chip Prober °³¹ß


2001 Blue LED¿ë Wafer Breaker °³¹ß
LPH Sorter °³¹ß


2000 Blue LED¿ë Wafer Scriber °³¹ß
LED Chip Counter °³¹ß


1999 Vision Inspection °ü·Ã ƯÇãÃëµæ
Atomic Force Microscopy Á¤¹Ð½ºÄ³´×½ºÅ×ÀÌÁö ¹× ±¤Çìµå°ü·Ã ƯÇãÃëµæ
¼ö±¤¼ÒÀÚ ÃøÁ¤±â(OPC-4000) °³¹ß


1998 Spectrometer(OPC-2000) °³¹ß
ÁöÇâ°¢ÃøÁ¤ÀåÄ¡(OPC-3000) °³¹ß
LED Chip ¿Ü°ü°Ë»çÀåÄ¡ °³¹ß


1997
ȸ»ç ⸳ (1997. 11. 7)

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