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Lighting Japan 2009 LED/OLED Lighting Technology Expo Âü°¡
Hong Kong International Lighting Fair 2009 (Autumn Edition)Âü°¡
Lighting Korea 2009 Âü°¡
LED EXPO 2009 Âü°¡
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Wafer-level ¹ß±¤¼ÒÀÚ ÁöÇâ°¢ ÃøÁ¤¹æ¹ý ¹× ÀåÄ¡ ƯÇãµî·Ï
LED Á¶¸í±â±â¸¦ À§ÇÑ ±¤ÃøÁ¤¹ý ƯÇãÃâ¿ø
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PD(Photo Diode) Goniometer (OPI-350) °³¹ß
Module Tester °³¹ß
ISO 9001:2000, KSA 9001:2001 ÀÎÁõȹµæ
2005 Çѱ¹»ê¾÷±â¼úÁøÈïÇùȸ ÀÎÁ¤ ±â¾÷ºÎ¼³¿¬±¸¼Ò ¼³¸³
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LED Thermal Tester(OPI-600) °³¹ß
Multi-channel LEOS °³¹ß
LED Temperature controllable Adapter(OPA-100) °³¹ß
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2004 Ÿ¿øÆí±¤ºÐ¼®±â ÀÚµ¿Á¤·Ä °ü·Ã ¹Ì±¹ ƯÇãÃëµæ
µî·ÏÁ¶¸í¿ë LED ÃøÁ¤±â¼ú Ç¥ÁØÈ Æ÷·³Âü¿©
´ëÇü Goniometer(OPI-310) °³¹ß
PD on Block Tester(OPI-500) ¹× PD Package Tester(OPI-510) °³¹ß
In-line LEOS °³¹ß
2003 LED Chip Prober, LEOS(OPI-100) °³¹ß
Goniophotometer(OPI-300) °³¹ß
Optical Power Meter(OPI-400) °³¹ß
2002 Rotating Analyzer Ellipsometer °³¹ß
Spectrometer ½ÅÁ¦Ç°(OPI-2100) °³¹ß
PD Chip Prober ¹× LED Chip Prober °³¹ß
2001 Blue LED¿ë Wafer Breaker °³¹ß
LPH Sorter °³¹ß
2000 Blue LED¿ë Wafer Scriber °³¹ß
LED Chip Counter °³¹ß
1999 Vision Inspection °ü·Ã ƯÇãÃëµæ
Atomic Force Microscopy Á¤¹Ð½ºÄ³´×½ºÅ×ÀÌÁö ¹× ±¤Çìµå°ü·Ã ƯÇãÃëµæ
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1998 Spectrometer(OPC-2000) °³¹ß
ÁöÇâ°¢ÃøÁ¤ÀåÄ¡(OPC-3000) °³¹ß
LED Chip ¿Ü°ü°Ë»çÀåÄ¡ °³¹ß
1997
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